Atomic-force Microscopy and Its Applications

Atomic-force microscopy (AFM) is a surface scanning technique that has sub-nanometer scale resolution. AFM describes a group of techniques used for non-destructive surface studies at the nanoscale. They have a resolution on the order of 103 times better than optical microscopy’s resolution limit. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force microscopy. This book is not only for students but also for professional engineers who are working in the industry as well as specialists. 

Print ISBN: 9781682519110 | $165 | 2023 | Hardcover

Subject: Chemistry

Editor: Seok Hyun Eom

About the Editor: Seok Hyun Eom holds PhD in Chemistry. His research interests are oxidative and nitrosative stress, free radicals and antioxidants, natural therapeutics, neurodegenerative diseases, brain tumors, and aging. His areas of interest include coordination chemistry, medicinal chemistry, green chemistry, and bioinorganic/organic chemistry. He reviews articles, delivers invited talks and lectures, and presents research papers at national and international conferences, seminars, webinars, and workshops.